Hobby Scale Dynamometer

Phase Four: Integration and Testing

Comprehensive Test Plan and Results

The following battery of tests will be conducted incrementally, with each successive test taking place after the successful completion of the previous test.  This plan is designed to bring the system into operation in the most logical order possible, with independent sub-systems being brought to their basic level of operation before full system integration.  The three independent subsystems will be constructed and tested in parallel.    

Test Battery for Electric Drive Subsystem

Initial Drive Bring-up

Purpose: This test will ensure communication between the instrumentation computer, embedded system and the ESC. 

Supported Requirements and Specifications: Varying the drive motor voltage and instrumentation computers communication with embedded platform.
Scheduled: February 28th

Conducted by: Patrick Gosack
Results: SUCCESSFUL.

Rotation Sensor Bring-up

Purpose: This test will clarify the implementation details of the rotation sensor in the electric drive subsystem.

Supported Requirements and Specifications: Varying the drive motor RPM and sensor chip communication with embedded platform.
Scheduled: February 28th

Conducted by: Patrick Gosack
Result: SUCCESSFUL.

First-Order Control Exercise

Purpose: This test will ensure the motor maintains a stable RPM under a variety of load conditions.

Supported Requirements and Specifications: Supports transient testing of MUT.
Scheduled: March 7th

Conducted by: Patrick Gosack
Result SUCCESSFUL.

Test Battery for Stand Subsystem

Construction of T-Slot Stand

Purpose: This test will ensure that the procured T-slot pieces fit together as planned.
Supported Requirements and Specifications.

Supports the specification of mechanically coupling the drive system and MUT, modularity and shock absorption.
Scheduled: February 28th

Conducted by: Mohammad
Result: SUCCESSFUL.

Mounting Electric Drive Subsystem to T-Slot Stand

Purpose: This test will ensure that the machined T-slot pieces couple to the electric drive subsystem as planned.
Supported Requirements and Specifications.
Scheduled: March 7th

Supports the specification of mechanically coupling the drive system and MUT, modularity and shock absorption.

Conducted by: Mohammad
Result: SUCCESSFUL.

Test Battery for Active Load Subsystem

Testing Functionality of Active Load

Purpose: This test will place the chosen load resistor and power MOSFET in series with a bench-top power supply, and use an embedded system and DAC to vary the current through the load resistor by modulating the gate voltage of the MOSFET.

Supported Requirements and Specifications:  Supports the capability of conducting transient and active tests with the device.

The result:
We have used Multi-sim software to simulate the below schematic to ensure we get the required result as discussed in section 6.9. We actually be able to drive the gate of the MOSFET as we needed. After that, we have built the circuit and functioned correctly. 

 Conducted by: Yasser

Testing Functionality of Hall Effect Sensor and Reading Load Voltage

Purpose: This test will test the functionality of the Hall Effect sensor by employing the previous load test-bench setup and verifying the correct reading of known currents through the load resistor.  This test will be conducted with the embedded system reading the current sensor and verifying these readings with a DMM.  The proper resistor size will be chosen for reading load voltage through an ADC and employment of voltage division.

Basically, we have not done this test due to the time consumed. However, we will provide a schematic for the next year students to complete this section as well.

 

Last Updated : 4/22/15