DIY AFM Using a Piezoelectric Buzzer

It is valuable for Electrical Engineering and Computer Engineering students to learn semiconductor metrology. The best way of teaching them is through hands-on practice using metrology equipment and tools. However, many metrology equipment for semiconductor measurement are very expensive.

 Is it possible to have homemade metrology tools just for training? While these tools will not be as accurate as SEM (Scanning Electron Microscopy), TEM (Transmission Electron Microscopy), SIMS (Secondary Ion Mass Spectrometry), or AFM (Atomic Force Microscopy), they can effectively demonstrate the principles and processes of semiconductor metrology technologies to undergraduate and high school students.

This project aims to create a DIY Atomic Force Microscope (AFM) using a piezoelectric buzzer. It is an ambitious but achievable project for educational purposes. This setup won't have the precision of a commercial AFM but can effectively demonstrate the principles of scanning probe microscopy.