Final Design Process
Wafer Testing
Wafer testing is our very first step for each batch of wafers we recieve. Once we have wafers delivered we immediatly begin to extensively test them until the team has enough data to perform analysis. To get an initial idea for a wafer, the blocks on a wafer are tested in a plus sign pattern. This allows the team to see if the top, bottom, left, and right sides of the wafer are of good quality. We can then detemine very quicky which wafers are best to proceed testing of the entire wafer. these are the initial test results from a wafer in Batch 4
Data Formatting
For data formatting this is more of a supportive system that assists with testing and analysis. When we get results for our testing data we have to have an intuitive way to store and name data. The naming conventions must all be the same formatting or else when we send the data to be parsed the code made for it will not work. With our data formatted correctly we can easily see what data is good and trace it back to the individual cell it came from. This makes pulling data and analysing data a lot easier as we can find where everything is.
Data Analysis
Data analysis subsystem is our last dependant subsystem. After taking all of the data from our wafer testing we parse the data using parsing code. We then examine the data to make connections in the results we get and the differences in manufacturing. Our data analysis is where we get to provide feedback for the client so they can make changes on their wafers. We see what criteria creates the best results then provide out client with this information so they can replicate good processes and discontinue bad ones. The image below is where we discovered an issue with heat in the manufacturing process since the center of the wafer is destroyed.
Probe Card Modification
The probe card was a component that was not completely neccesary for our project. We decided that we wanted to implement a probe card to potentially test wafers at a much faster rate. This modification would allow us to probe all 32 cells on an array at once instead of one cell at a time. this would save hundreds of hours that could be spend on other aspects of our project. Unfortunately the modification was taking too much time and money to implement for the time being. As a team we decided it would be best to allocate our resources elsewhere for the duration of the project.